公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2016 | Physical Thickness 1.x nm Ferroelectric HfZrOx Negative Capacitance FETs | M. H. Lee; S.-T. Fan; C.-H. Tang; P.-G. Chen; Y.-C. Chou; H.-H. Chen; J.-Y. Kuo; M.-J. Xie; S.-N. Liu; M.-H. Liao; C.-A. Jong; K.-S. Li; M.-C. Chen; C. W. Liu; LIN-SHAN LEE | International Electron Devices Meeting (IEDM) | |||
2018 | Sub-60mV/dec Subthreshold Swing on Reliability of Ferroelectric HfZrOx Negative-Capacitacne FETs with DC Sweep and AC Stress Cycles | M. H.Liao ; K.-T. Chen; C.-Y. Liao; R.-C. Hong; S.-S. Gu; Y.-C. Chou; Z.-Y. Wang; S.-Y.Chen; G.-Y. Siang; H.-Y. Chen; C. Lo; P.-G. Chen; Y.-J. Lee; K.-S.Li; S. T. Chang; M. H. Lee | 2018 International Conference on Solid State Devices and Materials |