Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2018 | Investigation of HfO2 thin films on Si by X-ray photoelectron spectroscopy, rutherford backscattering, grazing incidence X-ray diffraction and Variable Angle Spectroscopic Ellipsometry | Luo, X.; Li, Y.; Yang, H.; Liang, Y.; He, K.; Sun, W.; Yao, S.; Lu, X.; Wan, L.; Feng, Z.; HAO-HSIUNG LIN | Crystals | 52 | 54 | |
2020 | Lattice: An ADC/DAC-less ReRAM-based processing-in-memory architecture for accelerating deep convolution neural networks | Zheng, Q.; Wang, Z.; Feng, Z.; Yan, B.; Cai, Y.; Huang, R.; Chen, Y.; Yang, C.-L.; Li, H.H.; CHIA-LIN YANG | Proceedings - Design Automation Conference |