公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2013 | METHOD AND APPARATUS FOR EVALUATING WEIGHTING OF ELEMENTS OF DAC AND SAR ADC USING THE SAME | Hung-I Chen; Chang-Yu Chen; Xuan-Lun Huang; Jiun-Lang Huang; JIUN-LANG HUANG | ||||
2013 | SUCCESSIVE APPROXIMATION REGISTER ADC AND METHOD OF LINEARITY CALIBRATION THEREIN | Xuan-Lun Huang; Jiun-Lang Huang; JIUN-LANG HUANG | ||||
2006 | VLSI Test Principles and Architectures | Laung-Terng Wang; Cheng-Wen Wu; Xiaoqing Wen; Khader S. Abdel-Hafez; Wen-Ben Jone; Rohit Kapur; Brion Keller; Kuen-Jong Lee; CHIEN-MO LI ; Mike Peng Li; Xiaowei Li; T.M. Mak; Yinghua Min; Benoit Nadeau-Dostie; Soumendu Bhattacharya; Mehrdad Nourani; Janusz Rajski; Charles Stroud; Erik H. Volkerink; Duncan M. (Hank) Walker; Shianling Wu; Nur A. Touba; Abhijit Chatterjee; Xinghao Chen; Kwang-Ting (Tim) Cheng; William Eklow; Michael S. Hsiao; Jiun-Lang Huang; Shi-Yu Huang |