Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
1999 | SHEWMAC: an end-of-line SPC scheme for joint monitoring of process mean and variance | Fan, Chih-Min; SHI-CHUNG CHANG ; RUEY-SHAN GUO ; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, John | Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International Symposium on | 2 | 0 |