公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2004 | The comparison of isolation technologies and device models on SiGe bipolar low noise amplifier | CHEE-WEE LIU ; Hua, W.-C.; Yang, T.-Y.; CHEE-WEE LIU | Applied Surface Science | | | |
2005 | Threading Dislocation Induced Low Frequency Noise in Strained-Si nMOSFETs | Hua, W.-C.; Lee, M.H.; Chen, P.S.; Tsai, M.-J.; Liu, C.W. | IEEE Electron Device Letters | | | |
2005 | Threading dislocation induced low frequency noise in strained-Si nMOSFETs | CHEE-WEE LIU ; Hua, W.-C.; Lee, M.H.; Chen, P.S.; Tsai, M.-J.; CHEE-WEE LIU | IEEE Electron Device Letters | | | |