Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2020 | Valid Window: A New Metric to Measure the Reliability of NAND Flash Memory | Ye M; Li Q; Nie J; Kuo T.-W; Xue C.J.; TEI-WEI KUO | Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 |