Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
2015 | Wafer map failure pattern recognition and similarity ranking for large-scale data sets | Wu, M.-J.; Jang, J.-S.R.; Chen, J.-L.; JYH-SHING JANG | IEEE Transactions on Semiconductor Manufacturing | 216 | 162 |