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Issue Date	Title	Author(s)	Source	scopus	WOS	Fulltext/Archive link
2017	The systematic investigation of self-heating effect on CMOS Logic transistors from 20 nm to 5 nm technology nodes by experimental thermo-electric measurements and finite element modeling	M. H.Liao ; C.-P. Hsieh; C.-C. Lee	IEEE Transactions on Electron Devices
2017	Systematic Investigation of Self-Heating Effect on CMOS Logic Transistors from 20 to 5 nm Technology Nodes by Experimental Thermoelectric Measurements and Finite Element Modeling	Liao, M.-H. ; Hsieh, C.-P.; Lee, C.-C.	IEEE Transactions on Electron Devices	14	15
2012	The Systematic Study and Simulation Modeling on Dislocation Edge Stress Effects for Si N-MOSFETs	M.-H. Liao; MING-HAN LIAO	The 6th International Conference on Technological Advances of Thin Films & Surface Coatings
2012	The systematic study and simulation modeling on nano-level dislocation edge stress effects	Liao, M.-H.; Chen, C.-H.; Chang, L.-C.; Yang, C.; LiaoMH ; ChenCH	Journal of Applied Physics	10	5
2013	The demonstration of nonlinear analytic model for the strain field induced by thermal copper filled TSVs (through silicon via)	Liao, M.-H.; Chen, C.-H.; Lee, J.J.; Chen, K.C.; JYH-JONE LEE ; Liao, M.-H.	2013 e-Manufacturing and Design Collaboration Symposium	0	0
2009	The dependence of the performance of strained NMOSFETs on channel width	Yeh, L.; Liao, M.H.; Chen, C.H.; Wu, J.; Lee, J.Y.-M.; Liu, C.W.; Lee, T.L.; CHEE-WEE LIU ; Liao, M.H.	IEEE Transactions on Electron Devices	4	4
2006	The process and optoelectronic characterization of Ge-on-insulator	Lin, C.-H.; Yu, C.-Y.; Liao, M.H.; Huang, C.-F.; Lee, C.-J.; Lee, C.-Y.; CHEE-WEE LIU ; Liao, M.H.	ECS Transactions	1	0
2018	Thickness dependence of electrical conductivity and thermo-electric power of Bi2.0Te2.7Se0.3/Bi0.4Te3.0Sb1.6 thermo-electric devices	M. H.Liao ; K.-C. Huang; F.-A. Tsai; C.-Y. Liu; C. Lien; M.-H. Lee	AIP Advances
2018	Thickness dependence of electrical conductivity and thermo-electric power of Bi<inf>2.0</inf>Te<inf>2.7</inf>Se<inf>0.3</inf>/Bi<inf>0.4</inf>Te<inf>3.0</inf>Sb<inf>1.6</inf> thermo-electric devices	Liao, M.-H.; Huang, K.-C.; Tsai, F.-A.; Liu, C.-Y.; Lien, C.; Lee, M.-H.; MING-HAN LIAO	AIP Advances	9	9
2015	利用拉曼光譜檢測半導體缺陷技術	廖洺漢 ; 陳畤華; 謝卓帆

Showing results 188 to 197 of 197 < previous