公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2011 | Rotational Positioning System Adapted to Atomic Force Microscope for Measuring Anisotropic Surface Properties | H.-S. Liao; B.-J. Juang; W.-C. Chang; W.-C. Lai; K.-Y. Huang; C.-S. Chang; HSIEN-SHUN LIAO | REVIEW OF SCIENTIFIC INSTRUMENTS |