公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
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2020 | SVM-Based Root Identification Algorithm Using Ridge Features and Eroded Masks | Ding J.-J; Cheng J.-C; Lu X.-C; Tsai S.-F; Li H.-J; Liu H.-C; Liou Y.-J; CHO-YING HUANG ; JIAN-JIUN DING | 2020 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2020 | 1 | 0 |