Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2012 | Systematic Open Via Diagnosis Based on Physical Features | CHIEN-MO LI ; P. J. Chen; C. C. Che; J. C. M. Li; K. Y. Tsai; S. F. Kuo; P. Y. Hsueh; Y. Y. Chen; J. N. Lee; CHIEN-MO LI | IEEE Silicon Debug and Diagnosis Workshop |