公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2008 | Polarity change of threshold voltage shifts for n-channel polycrystalline silicon thin-film transistors stressed by negative gate bias | CHEE-WEE LIU ; Huang, C.-F.; Yang, Y.-J.; Peng, C.-Y.; Sun, H.-C.; Liu, C.W.; Hsu, Y.-C.; Shih, C.-C.; Chen, J.-S.; CHEE-WEE LIU | ECS Transactions | | | |
2013 | Radiation impact of EUV on high-performance Ge MOSFETs | CHEE-WEE LIU ; Chen, Y.-T.; Chang, H.-C.; Wong, I.-H.; Sun, H.-C.; Ciou, H.-J.; Yeh, W.-T.; Luo, S.-J.; CHEE-WEE LIU | IEEE Electron Device Letters | | | |
2011 | Recovery of light induced degradation of micromorph solar cells by reverse bias | CHEE-WEE LIU ; Sun, H.-C.; Chen, W.-D.; Cheng, T.H.; Yang, Y.-J.; Liu, C.W.; Shih, H.-T.; CHEE-WEE LIU | ECS Transactions | | | |
2008 | Stress-induced hump effects of p-channel polycrystalline silicon thin-film transistors | CHEE-WEE LIU ; Huang, C.-F.; Peng, C.-Y.; Yang, Y.-J.; Sun, H.-C.; Chang, H.-C.; Kuo, P.-S.; Chang, H.-L.; Liu, C.-Z.; CHEE-WEE LIU | IEEE Electron Device Letters | | | |
2010 | Threshold voltage and mobility extraction of NBTI degradation of poly-Si thin-film transistors | CHEE-WEE LIU ; Sun, H.-C.; Huang, C.-F.; Chen, Y.-T.; Wu, T.-Y.; Liu, C.W.; Hsu, Y.-J.; Chen, J.-S.; CHEE-WEE LIU | IEEE Transactions on Electron Devices | | | |