公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2000 | Static property checking using ATPG vs. BDD techniques. | Huang, Chung-Yang; Yang, Bwolen; Tsai, Huan-Chih; Cheng, Kwang-Ting; CHUNG-YANG HUANG | Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000 |