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Yinghua Min
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Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
2006 | VLSI Test Principles and Architectures | Laung-Terng Wang; Cheng-Wen Wu; Xiaoqing Wen; Khader S. Abdel-Hafez; Wen-Ben Jone; Rohit Kapur; Brion Keller; Kuen-Jong Lee; CHIEN-MO LI ; Mike Peng Li; Xiaowei Li; T.M. Mak; Yinghua Min; Benoit Nadeau-Dostie; Soumendu Bhattacharya; Mehrdad Nourani; Janusz Rajski; Charles Stroud; Erik H. Volkerink; Duncan M. (Hank) Walker; Shianling Wu; Nur A. Touba; Abhijit Chatterjee; Xinghao Chen; Kwang-Ting (Tim) Cheng; William Eklow; Michael S. Hsiao; Jiun-Lang Huang; Shi-Yu Huang | | | | |