公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2004 | Package-strain-enhanced device and circuit performance | Maikap, S.; MING-HAN LIAO ; Yuan, F.; Lee, M.H.; Huang, C.-F.; Chang, S.T.; CHEE-WEE LIU | Technical Digest - International Electron Devices Meeting, IEDM | 21 | 0 | |
2004 | Performance Enhancement of High-Speed SiGe Based Heterojunction Phototransistor with Substrate Terminal | Shi, Jin-Wei; Pei, Z.; Yuan, F.; Hsu, Y.-M.; Liu, C.-W.; Lu, S. C.; Tsai, M.-J. | Applied Physics Letters | | | |
2004 | Performance enhancement of high-speed SiGe-based heterojunction phototransistor with substrate terminal | Shi, J.-W.; Pel, Z.; Yuan, F.; Hsu, Y.-M.; Liu, C.-W.; Lu, S.C.; Tsai, M.-J.; CHEE-WEE LIU | Applied Physics Letters | 6 | 5 | |
2002 | Roughness- Enhanced Reliability of MOS Tunneling Diodes | Lin, C.-H.; Yuan, F.; Shie, C.-R.; Chen, K.-F.; Hsu, B.-C.; Lee, M.H.; Pai, W.W.; Liu, C.W. | IEEE Electron Device Letters | | | |
2002 | Roughness-enhanced reliability of MOS tunneling diodes | Lin, C.-H.; Yuan, F.; Shie, C.-R.; Chen, K.-F.; Hsu, B.-C.; Lee, M.H.; Pai, W.W. ; CHEE-WEE LIU | IEEE Electron Device Letters | 6 | 7 | |