公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2008 | Investigation of reliability characteristics in NMOS and PMOS FinFETs | Liao, W.-S.; Liaw, Y.-G.; Tang, M.-C.; Chakraborty, S.; Liu, C.W.; CHEE-WEE LIU | IEEE Electron Device Letters | 30 | 26 | |
2003 | Isotope effect of hydrogen release in metal/oxide/n-silicon tunneling diodes | Lin, C.-H.; Yuan, F.; Hsu, B.-C.; Liu, C.W.; CHEE-WEE LIU | Solid-State Electronics | 4 | 3 | |
2015 | Junctionless Gate-all-around pFETs on Si with In-situ doped Ge channel | Wong, I.-H.; Chen, Y.-T.; Huang, S.-H.; Tu, W.-H.; Huang, C.-H.; Chen, Y.-S.; Shieh, T.-C.; Liu, C.W.; CHEE-WEE LIU | International Symposium on VLSI Technology, Systems, and Applications | 0 | 0 | |
2015 | Junctionless Gate-All-Around pFETs Using In-situ Boron-Doped Ge Channel on Si | Wong, I.-H.; Chen, Y.-T.; Huang, S.-H.; Tu, W.-H.; Chen, Y.-S.; Liu, C.W.; CHEE-WEE LIU | IEEE Transactions on Nanotechnology | 25 | 25 | |
2010 | Laser annealing and local heating effects during raman measurement of hydrogenated amorphous silicon films | Yang, Y.-J.; YI-HSUAN YANG ; Peng, C.-Y.; Liu, C.W.; CHIH-WEN LIU | ECS Transactions | 0 | 0 | |
2012 | LDMOS transistor high-frequency performance enhancements by strain | Chen, K.-M.; Huang, G.-W.; Chen, B.-Y.; Chiu, C.-S.; Hsiao, C.-H.; Liao, W.-S.; Chen, M.-Y.; Yang, Y.-C.; Wang, K.-L.; Liu, C.W.; CHEE-WEE LIU | IEEE Electron Device Letters | 15 | 12 | |
1999 | Light emission and detection by metal oxide silicon tunneling diodes | Liu, C.W.; Lee, M.H.; Lin, C.F.; Lin, I.C.; Liu, W.T.; Lin, H.H.; LiuCW | Electron Devices Meeting, 1999. IEDM | 0 | 0 | |
1999 | Light emission and detection by metal oxide silicon tunneling diodes | Liu, C.W.; Lee, M.H.; Lin, C.F.; Lin, I.C.; Liu, W.T.; Lin, H.H.; CHING-FUH LIN | International Electron Devices Meeting, IEDM | | | |
1999 | Light emission and detection by metal oxide silicon tunneling diodes | Liu, C.W.; Lee, M.H.; Lin, C.F.; Lin, I.C.; Liu, W.T.; Lin, H.H.; CHEE-WEE LIU | International Electron Devices Meeting, IEDM | | | |
2008 | Logic 90 nm n-channel field effect transistor current and speed enhancements through external mechanical package straining | Liao, W.-S.; Huang, S.-Y.; Tang, M.-C.; Liaw, Y.-G.; Chen, K.-M.; Shih, T.; Tsen, H.-C.; Chung, L.; Liu, C.W.; CHEE-WEE LIU | Japanese Journal of Applied Physics | 1 | 1 | |
2016 | Low contact resistivity (1.5×10-8 Ω-cm2) of phosphorus-doped Ge by in-situ chemical vapor deposition doping and laser annealing | Huang, S.-H.; Lu, F.-L.; Liu, C.W.; CHEE-WEE LIU | 2016 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2016 | 1 | 0 | |
2020 | Low Contact Resistivity to Ge Using In-Situ B and Sn Incorporation by Chemical Vapor Deposition | Tsai, C.-E.; Lu, F.-L.; Liu, Y.-C.; Ye, H.-Y.; Liu, C.W.; CHEE-WEE LIU | IEEE Transactions on Electron Devices | 3 | 3 | |
1997 | Low temperature chemical vapor deposition growth of β-SiC on (100) Si using methylsilane and device characteristics | Liu, C.W.; Sturm, J.C.; CHEE-WEE LIU | Journal of Applied Physics | | | |
2006 | Low-temperature fabrication and characterization of Ge-on-insulator structures | Yu, C.-Y.; Lee, C.-Y.; Lin, C.-H.; Liu, C.W.; CHEE-WEE LIU | Applied Physics Letters | 26 | 23 | |
2020 | Manifestation of strong correlations in transport in ultraclean SiGe/Si/SiGe quantum wells | Shashkin, A.A.; Melnikov, M.Y.; Dolgopolov, V.T.; Radonji?, M.M.; Dobrosavljevi?, V.; Huang, S.-H.; Liu, C.W.; Zhu, A.Y.X.; Kravchenko, S.V.; CHEE-WEE LIU | Physical Review B | 6 | 6 | |
2004 | Mechanically strained Si-SiGe HBTs | Yuan, F.; Jan, S.-R.; Maikap, S.; Liu, Y.-H.; Liang, C.-S.; Liu, C.W.; CHEE-WEE LIU | IEEE Electron Device Letters | 15 | 12 | |
2004 | Mechanically strained Si/SiGe HBTs | Yuan, F.; Jan, S.-R.; Maikap, S.; Liu, Y.-H.; Liang, C.-S.; Liu, C.W. | IEEE Electron Device Letters | | | |
2004 | Mechanically Strained Strained-Si NMOSFETs | Maikap, S.; Yu, C.-Y.; Jan, S.-R.; Lee, M.H.; Liu, C.W.; CHEE-WEE LIU | IEEE Electron Device Letters | 24 | 21 | |
2004 | Mechanically strained strained-Si NMOSFETs | Maikap, S.; Yu, C.-Y.; Jan, S.-R.; Lee, M.H.; Liu, C.W. | IEEE Electron Device Letters | | | |
2006 | Metal gate/High-K dielectric stack on Si cap/ultra-thin pure Ge epi/Si substrate | Yeo, C.C.; Lee, M.H.; Liu, C.W.; Choi, K.J.; Lee, T.W.; Cho, B.J.; CHEE-WEE LIU | 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC | 0 | 0 | |