| Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
| 2005 | Calculation of the electron mobility in silicon inversion layers: Dependence on surface orientation, channel direction, and stress | Yang, I.-J.; Peng, C.-Y.; Chang, S.T.; Liu, C.W.; CHEE-WEE LIU | 2005 International Semiconductor Device Research Symposium | | | |
| 2010 | Capacitorless 1T memory cells using channel traps at grain boundaries | Chen, Y.-T.; Sun, H.-C.; Huang, C.-F.; Wu, T.-Y.; Liu, C.W.; Hsu, Y.-J.; Chen, J.-S.; CHEE-WEE LIU | IEEE Electron Device Letters | 6 | 7 | |
| 2008 | Carrier gas effects on the SiGe quantum dots formation | Lee, C.-H.; Yu, C.-Y.; Lin, C.M.; Liu, C.W.; Lin, H.; Chang, W.-H.; CHEE-WEE LIU | Applied Surface Science | 2 | 2 | |
| 2001 | Carrier lifetime measurement on electroluminescent metal-oxide-silicon tunneling diodes | Chen, M.-J.; Lin, C.-F.; Lee, M.H.; Chang, S.T.; Liu, C.W.; MIIN-JANG CHEN | Applied Physics Letters | 10 | 10 | |
| 2001 | Carrier lifetime measurement on electroluminescent metal-oxide-silicon tunneling diodes | Chen, M.-J.; Lin, C.-F.; Lee, M.H.; Chang, S.T.; Liu, C.W.; CHING-FUH LIN ; CHEE-WEE LIU | Applied Physics Letters | 10 | 10 | |
| 2000 | Changes of ground water level in response to the Chi-Chi Earthquake | Chia, Y.P.; Wang, Y.S.; Wu, H.P.; Huang, C.J.; Liu, C.W.; Lin, M.L.; Jeng, F.S. | Proc. International Workshop Annual Commemoration of Chi-Chi Earthquake | | | |
| 2007 | Characteristics of strained-germanium p- and n-channel field effect transistors on a Si (1 1 1) substrate | Maikap, S.; Lee, M.H.; Chang, S.T.; Liu, C.W.; CHEE-WEE LIU | Semiconductor Science and Technology | 25 | 25 | |
| 2012 | Characterizing the field-dependent T1-relaxation and imaging of ferrofluids using high-Tc superconducting quantum interference device magnetometer in low magnetic fields | Liao, S.H.; Yang, H.-C.; Horng, H.E.; Liu, C.W.; Chen, H.H.; Chen, M.J.; Chen, K.L.; Liu, C.I.; Wang, L.M.; LI-MIN WANG | Journal of Applied Physics | 4 | 4 | |
| 2004 | CMOS optoelectronics | Liu, C.W.; Hsu, B.-C.; CHEE-WEE LIU | Electrochemical Society | | | |
| 2016 | Compact modeling and simulation of TSV with experimental verification | Yan, J.-Y.; Jan, S.-R.; Huang, Y.-C.; Lan, H.-S.; Liu, C.W.; Huang, Y.-H.; Hung, B.; Chan, K.-T.; Huang, M.; Yang, M.-T.; CHEE-WEE LIU | 2016 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2016 | 1 | 0 | |
| 2010 | Competitiveness between direct and indirect radiative transitions of Ge | Cheng, T.-H.; Ko, C.-Y.; Chen, C.-Y.; Peng, K.-L.; Luo, G.-L.; Liu, C.W.; Tseng, H.-H.; CHEE-WEE LIU | Applied Physics Letters | 52 | 46 | |
| 2010 | Composition redistribution of self-assembled Ge islands on Si (001) during annealing | Lee, S.W.; Chang, H.T.; Lee, C.H.; Cheng, S.L.; Liu, C.W.; CHEE-WEE LIU | Thin Solid Films | 7 | 6 | |
| 2008 | Comprehensive study of bias temperature instability on polycrystalline silicon thin-film transistors | Huang, C.-F.; Chen, Y.-T.; Sun, H.-C.; Liu, C.W.; Hsu, Y.-C.; Shih, C.-C.; Lin, K.-C.; Chen, J.-S.; CHEE-WEE LIU | International Conference on Solid-State and Integrated Circuits Technology, ICSICT | 3 | 0 | |
| 2001 | A Comprehensive Study of Gate Inversion Current of Metal-Oxide-Silicon Tunneling diodes | Lin, C.-H.; Hsu, B.-C.; Lee, M.H.; Liu, C.W. | IEEE Transactions on Electron Devices | | |  |
| 2009 | Comprehensive study of the Raman shifts of strained silicon and germanium | Peng, C.-Y.; Huang, C.-F.; Fu, Y.-C.; Yang, Y.-H.; Lai, C.-Y.; Chang, S.-T.; Liu, C.W.; CHEE-WEE LIU | Journal of Applied Physics | 57 | 54 | |
| 2007 | Comprehensive study on dynamic bias temperature instability of p-channel polycrystalline silicon thin-film transistors | Huang, C.-F.; Yang, Y.-J.; Peng, C.-Y.; Sun, H.-C.; Liu, C.W.; Chao, C.-W.; Lin, K.-C.; CHEE-WEE LIU | 2007 International Semiconductor Device Research Symposium | 0 | 0 | |
| 2001 | Correlation between Si-H/D bond desorption and injected electron energy in metal-oxide-silicon tunneling diodes | Lin, C.-H.; Lee, M.H.; Liu, C.W.; CHEE-WEE LIU | Applied Physics Letters | 10 | 8 | |
| 2007 | Dark current reduction of Ge MOS photodetectors by high work function electrodes | Kuo, P.-S.; Fu, Y.-C.; Chang, C.-C.; Lee, C.-H.; Liu, C.W.; CHEE-WEE LIU | Electronics Letters | 5 | 5 | |
| 2011 | Defect related negative temperature coefficiency of short circuit current of Cu(In, Ga)Se 2 solar cells | Cheng, T.-H.; Chen, J.Y.; Hsu, W.W.; Liu, C.W.; Hsiao, C.Y.; Tseng, H.R.; CHIH-WEN LIU | IEEE Photovoltaic Specialists Conference | 0 | 0 | |
| 2011 | Defect related negative temperature coefficiency of short circuit current of Cu(In, Ga)Se <inf>2</inf> solar cells | Cheng, T.-H.; Chen, J.Y.; Hsu, W.W.; Liu, C.W.; Hsiao, C.Y.; Tseng, H.R.; CHEE-WEE LIU | Conference Record of the IEEE Photovoltaic Specialists Conference | 0 | 0 | |
