| Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
| 2015 | Junctionless Gate-all-around pFETs on Si with In-situ doped Ge channel | Wong, I.-H.; Chen, Y.-T.; Huang, S.-H.; Tu, W.-H.; Huang, C.-H.; Chen, Y.-S.; Shieh, T.-C.; Liu, C.W.; CHEE-WEE LIU | International Symposium on VLSI Technology, Systems, and Applications | 0 | 0 | |
| 2015 | Junctionless Gate-All-Around pFETs Using In-situ Boron-Doped Ge Channel on Si | Wong, I.-H.; Chen, Y.-T.; Huang, S.-H.; Tu, W.-H.; Chen, Y.-S.; Liu, C.W.; CHEE-WEE LIU | IEEE Transactions on Nanotechnology | 17 | 20 | |
| 2010 | Laser annealing and local heating effects during raman measurement of hydrogenated amorphous silicon films | Yang, Y.-J.; Yang, Y.-H.; Peng, C.-Y.; Liu, C.W.; CHIH-WEN LIU | ECS Transactions | 0 | 0 | |
| 2012 | LDMOS transistor high-frequency performance enhancements by strain | Chen, K.-M.; Huang, G.-W.; Chen, B.-Y.; Chiu, C.-S.; Hsiao, C.-H.; Liao, W.-S.; Chen, M.-Y.; Yang, Y.-C.; Wang, K.-L.; Liu, C.W.; CHEE-WEE LIU | IEEE Electron Device Letters | 10 | 8 | |
| 1999 | Light emission and detection by metal oxide silicon tunneling diodes | Liu, C.W.; Lee, M.H.; Lin, C.F.; Lin, I.C.; Liu, W.T.; Lin, H.H.; LiuCW | Electron Devices Meeting, 1999. IEDM | 0 | 0 |  |
| 1999 | Light emission and detection by metal oxide silicon tunneling diodes | Liu, C.W.; Lee, M.H.; Lin, C.F.; Lin, I.C.; Liu, W.T.; Lin, H.H.; CHEE-WEE LIU | International Electron Devices Meeting, IEDM | | | |
| 1999 | Light emission and detection by metal oxide silicon tunneling diodes | Liu, C.W.; Lee, M.H.; Lin, C.F.; Lin, I.C.; Liu, W.T.; Lin, H.H.; CHING-FUH LIN | International Electron Devices Meeting, IEDM | | | |
| 2004 | Light emission from Al/HfO2/silicon diodes | Chen, T.C.; Lai, W.Z.; Liang, C.Y.; Chen, M.J.; Lee, L.S.; Liu, C.W.; CHEE-WEE LIU | Journal of Applied Physics | 8 | 8 | |
| 2004 | Light emission from Al/HfO<inf>2</inf>/silicon diodes | Chen, T.C.; Lai, W.Z.; Liang, C.Y.; Chen, M.J.; Lee, L.S.; Liu, C.W.; MIIN-JANG CHEN | Journal of Applied Physics | 8 | 8 | |
| 2008 | Logic 90 nm n-channel field effect transistor current and speed enhancements through external mechanical package straining | Liao, W.-S.; Huang, S.-Y.; Tang, M.-C.; Liaw, Y.-G.; Chen, K.-M.; Shih, T.; Tsen, H.-C.; Chung, L.; Liu, C.W.; CHEE-WEE LIU | Japanese Journal of Applied Physics | 1 | 1 | |
| 2016 | Low contact resistivity (1.5×10-8 Ω-cm2) of phosphorus-doped Ge by in-situ chemical vapor deposition doping and laser annealing | Huang, S.-H.; Lu, F.-L.; Liu, C.W.; CHEE-WEE LIU | 2016 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2016 | 0 | 0 | |
| 1997 | Low temperature chemical vapor deposition growth of β-SiC on (100) Si using methylsilane and device characteristics | Liu, C.W.; Sturm, J.C.; CHEE-WEE LIU | Journal of Applied Physics | | | |
| 2006 | Low-temperature fabrication and characterization of Ge-on-insulator structures | Yu, C.-Y.; Lee, C.-Y.; Lin, C.-H.; Liu, C.W.; CHEE-WEE LIU | Applied Physics Letters | 23 | 22 | |
| 2016 | Magneto-transport analysis of an ultra-low-density two-dimensional hole gas in an undoped strained Ge/SiGe heterostructure | Laroche, D.; Huang, S.-H.; Chuang, Y.; Li, J.-Y.; Liu, C.W.; Lu, T.M.; JIUN-YUN LI ; CHEE-WEE LIU | Applied Physics Letters | 10 | 10 | |
| 2015 | Magneto-transport of an electron bilayer system in an undoped Si/SiGe double-quantum-well heterostructure | Laroche, D.; Huang, S.-H.; Nielsen, E.; Liu, C.W.; Li, J.-Y.; Lu, T.M.; JIUN-YUN LI ; CHEE-WEE LIU | Applied Physics Letters | 2 | 2 | |
| 2013 | Manganese K- and L<inf>3</inf>-edge X-ray absorption fine structure study of Zn<inf>1-x</inf>Mn<inf>x</inf>Te | Zheng, W.; Jang, L.-Y.; Lee, J.-M.; Zheng, R.S.; Liu, C.W.; Becla, P.; Feng, Z.C.; CHEE-WEE LIU | Advanced Materials Research | 3 | 0 | |
| 2006 | Mechanical strain effect of n-channel polycrystalline silicon thin-film transistors | Huang, C.-F.; Yang, Y.-J.; Peng, C.-Y.; Yuan, F.; Liu, C.W.; CHEE-WEE LIU | Applied Physics Letters | 17 | 14 | |
| 2004 | Mechanically strained Si-SiGe HBTs | Yuan, F.; Jan, S.-R.; Maikap, S.; Liu, Y.-H.; Liang, C.-S.; Liu, C.W.; CHEE-WEE LIU | IEEE Electron Device Letters | 14 | 11 | |
| 2004 | Mechanically strained Si/SiGe HBTs | Yuan, F.; Jan, S.-R.; Maikap, S.; Liu, Y.-H.; Liang, C.-S.; Liu, C.W. | IEEE Electron Device Letters | | | |
| 2004 | Mechanically strained strained-Si NMOSFETs | Maikap, S.; Yu, C.-Y.; Jan, S.-R.; Lee, M.H.; Liu, C.W. | IEEE Electron Device Letters | | | |
