公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
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2014 | Roles of interface and oxide trap density in the kinked current behavior of Al/SiO2/Si(p) structures with ultra-thin oxides | Lu, H.-W.; Hwu, J.-G.; JENN-GWO HWU | Applied Physics A: Materials Science and Processing | 11 | 13 |