公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
1991 | Enhanced Controllability for IDDQ Test Sets Using Partial Scan. | Chakraborty, Tapan J.; Bhawmik, Sudipta; Bencivenga, Robert; Lin, Chih-Jen; CHIH-JEN LIN | Proceedings of the 28th Design Automation Conference, San Francisco, California, USA, June 17-21, 1991. |