公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
1993 | Ab Initio Calculation of Band Structure, X-ray Emission, Quantum Yield and Electron-Energy-Loss Spectra of Hexagonal Boron Nitride | Ma, H.; 林聖賢; Carpenter, R. W.; Rice, P.; Sankey, O. F.; Lin, Sheng-Hsien | Journal of Applied Physics | | | |
1991 | Ab Initio Study of the Valence-electron Relaxation Effect on X-ray Emission Spectra and the Excitionic Effect on Electron-energy-loss Spectra of the SiL2,3 Edge | Ma, H.; 林聖賢; Carpenter, R. W.; Sankey, O. F.; Lin, Sheng-Hsien | Physical Review | | | |
1988 | Analysis of Valence Shell Electronic Excitations in Si and Its Refractory Compounds Using Electron Energy Loss Microspectroscopy | Skiff, W. M.; Carpenter, R. W.; 林聖賢; Lin, Sheng-Hsien | Journal of Applied Physics | | | |
1988 | K,L,M,N,O and P Ionization Cross Sections for Electron Energy Loss Spectroscopy | Skiff, W. M.; Carpenter, R. W.; 林聖賢; Lin, Sheng-Hsien | Ultramicroscopy | | | |
1987 | Near-edge Fine Structure Analysis of Core Shell Electronic Absorption Edges in Si and Its Refractory Compounds Using Electron Energy Loss Microscopy | Skiff, W. M.; Carpenter, R. W.; 林聖賢; Lin, Sheng-Hsien | Journal of Applied Physics | | | |
1985 | SiL Core Edge Fine Structure in an Oxidation Series of Silicon Compounds:a Comparison of Micro Electron Energy Loss Spectra with Theory | Skiff, W. M.; Carpenter, R. W.; 林聖賢; Lin, Sheng-Hsien | Journal of Applied Physics | | | |
1990 | Study of the Interfacial Concentratin Profile of Two Component Systems in the Solid-Solid Interface | Tapia, N.; Ma, H.; 林聖賢; Carpenter, R. W.; Lin, Sheng-Hsien | Materials Letters | | | |
1990 | Theoretical Comparison of Electron Energy-Loss and X-ray Absorption Near-Edge Fine Structure of SiL2,3 Edge | Ma, H.; 林聖賢; Carpenter, R. W.; Sankey, O. F.; Lin, Sheng-Hsien | Journal of Applied Physics | | | |