公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
1986 | Relationship between mobile charges and interface trap states in silicon mos capacitors | Hwu, J.-G.; Wang, W.-S.; Chiou, Y.-L.; JENN-GWO HWU | Journal of the Chinese Institute of Engineers, Transactions of the Chinese Institute of Engineers,Series A/Chung-kuo Kung Ch'eng Hsuch K'an | 0 | 0 |