公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2009 | MAGNIFYING THE NANOWORLD: AN EDUCATIONAL ATOMIC FORCE MICROSCOPE | H.-S. Liao; K.-Y. Huang; C.-S. Chang; C.-K. Lin; S.-K. Hung; HSIEN-SHUN LIAO | The ASME Asia-Pacific Engineering Education Congress, 2009 | |||
2011 | Rotational Positioning System Adapted to Atomic Force Microscope for Measuring Anisotropic Surface Properties | H.-S. Liao; B.-J. Juang; W.-C. Chang; W.-C. Lai; K.-Y. Huang; C.-S. Chang,; KUANG-YUH HUANG | Review of Scientific Instruments | |||
2011 | Rotational Positioning System Adapted to Atomic Force Microscope for Measuring Anisotropic Surface Properties | H.-S. Liao; B.-J. Juang; W.-C. Chang; W.-C. Lai; K.-Y. Huang; C.-S. Chang; HSIEN-SHUN LIAO | REVIEW OF SCIENTIFIC INSTRUMENTS |