Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2010 | Analysis of breakdown characteristics in high-k dielectrics under electrostatic discharge impulse stress | Chun-Heng Chen; Ming Han Liao; Fu-Chien Chiu; Huey-Liang Hwang; MING-HAN LIAO | J. Appl. Phys |