Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
2010 | Modeling the Floating-Body-Effect-Induced Drain Current Behavior of 40nm PD SOI NMOS Device Via SPICE BJT/MOS Model Approach | J. S. Su; J. B. Kuo; D. Chen; C. S. Yeh; JAMES-B KUO | EUROSOI | |||
2009 | Modeling the Floating-Body-Effect-Induced Drain Current Behavior of PD SOI NMOS Device Via SPICE BJT/MOS Model Approach | J. S. Su; J. B. Kuo; JAMES-B KUO | Compact TFT Modeling Workshop | 0 | 0 | |
2008 | Transient Behavior of 40nm PD SOI NMOS Device Considering STI-Induced Mechanical Stress Effects | J. S. Su; J. B. Kuo; JAMES-B KUO | IEDMS |