公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
1999 | SHEWMAC: an end-of-line SPC scheme for joint monitoring of process mean and variance | Fan, Chih-Min; SHI-CHUNG CHANG ; RUEY-SHAN GUO ; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, John | Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International Symposium on | 2 | 0 |