公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2020 | Automatic IR-Drop ECO Using Machine Learning | Lin H.-Y; Fang Y.-C; Liu S.-T; Chen J.-X; Li C.-M; Fang E.J.-W.; CHIEN-MO LI | Proceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020 | |||
2021 | Chip Performance Prediction Using Machine Learning Techniques | Su M.-Y; Lin W.-C; Kuo Y.-T; Li C.-M; Fang E.J.-W; Hsueh S.S.-Y.; CHIEN-MO LI | 2021 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2021 - Proceedings |