Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
2010 | Analysis of breakdown characteristics in high-k dielectrics under electrostatic discharge impulse stress | Chun-Heng Chen; Ming Han Liao; Fu-Chien Chiu; Huey-Liang Hwang; MING-HAN LIAO | J. Appl. Phys | |||
2009 | The Dependence of the Performance of Strained NMOSFETs on Channel Width | Lingyen Yeh; Ming Han Liao; Chun Heng Chen; Jun Wu; Joseph Ya-min Lee; Chee Wee Liu; T. L. Lee; M. S. Liang; MING-HAN LIAO | IEEE Trans. on Electron Devices |