公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2014 | Physical-aware Systematic Multiple Defect Diagnosis | CHIEN-MO LI ; P. J. Chen; C. C. Che; J. C. M. Li; S. F. Kuo; P. Y. Hsueh; C. Y. Kuo; J. N. Lee; CHIEN-MO LI | IET Proceedings Computers and Digital Techniques | 10 | ||
2012 | Systematic Open Via Diagnosis Based on Physical Features | CHIEN-MO LI ; P. J. Chen; C. C. Che; J. C. M. Li; K. Y. Tsai; S. F. Kuo; P. Y. Hsueh; Y. Y. Chen; J. N. Lee; CHIEN-MO LI | IEEE Silicon Debug and Diagnosis Workshop |