公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
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2008 | On optimizing fault coverage, pattern count, and ATPG run time using a hybrid single-capture scheme for testing scan designs | Wu, S.; Wang, L.-T.; Jiang, Z.; Song, J.; Sheu, B.; Wen, X.; Hsiao, M.S.; Li, J.C.-M.; Huang, J.-L.; CHIEN-MO LI ; JIUN-LANG HUANG | Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems | 1 | 0 |