公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2009 | A design of 1T memory cells using channel traps for long data retention time | CHEE-WEE LIU ; Chen, Y.-T.; Huang, C.-F.; Sun, H.-C.; Wu, T.-Y.; Ku, C.-Y.; Liu, C.W.; Hsu, Y.-C.; Chen, J.-S.; CHEE-WEE LIU | 2009 International Semiconductor Device Research Symposium | | | |
2008 | A new NBTI characterization method on polycrystalline silicon thin-film transistors | CHEE-WEE LIU ; Sun, H.-C.; Huang, C.-F.; Chen, Y.-T.; Liu, C.W.; Hsu, Y.-C.; Shih, C.-C.; Chen, J.-S.; CHEE-WEE LIU | IDW '08 - 15th International Display Workshops | | | |
2010 | Capacitorless 1T memory cells using channel traps at grain boundaries | CHEE-WEE LIU ; Chen, Y.-T.; Sun, H.-C.; Huang, C.-F.; Wu, T.-Y.; Liu, C.W.; Hsu, Y.-J.; Chen, J.-S.; CHEE-WEE LIU | IEEE Electron Device Letters | | | |
2008 | Comprehensive study of bias temperature instability on polycrystalline silicon thin-film transistors | CHEE-WEE LIU ; Huang, C.-F.; Chen, Y.-T.; Sun, H.-C.; Liu, C.W.; Hsu, Y.-C.; Shih, C.-C.; Lin, K.-C.; Chen, J.-S.; CHEE-WEE LIU | International Conference on Solid-State and Integrated Circuits Technology, ICSICT | | | |
2007 | Comprehensive study on dynamic bias temperature instability of p-channel polycrystalline silicon thin-film transistors | CHEE-WEE LIU ; Huang, C.-F.; Yang, Y.-J.; Peng, C.-Y.; Sun, H.-C.; Liu, C.W.; Chao, C.-W.; Lin, K.-C.; CHEE-WEE LIU | 2007 International Semiconductor Device Research Symposium | | | |
2009 | Dynamic bias instability of p-channel polycrystalline-silicon thin-film transistors induced by impact ionization | CHEE-WEE LIU ; Huang, C.-F.; Sun, H.-C.; Yang, Y.-J.; Chen, Y.-T.; Ku, C.-Y.; Liu, C.W.; Hsu, Y.-J.; Shih, C.-C.; Chen, J.-S.; CHEE-WEE LIU | IEEE Electron Device Letters | | | |
2009 | Dynamic bias temperature instability of p-channel polycrystalline silicon thin-film transistors | CHEE-WEE LIU ; Huang, C.-F.; Sun, H.-C.; Kuo, P.-S.; Chen, Y.-T.; Liu, C.W.; Hsu, Y.-J.; Chen, J.-S.; CHEE-WEE LIU | International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA | | | |
2008 | Polarity change of threshold voltage shifts for n-channel polycrystalline silicon thin-film transistors stressed by negative gate bias | CHEE-WEE LIU ; Huang, C.-F.; Yang, Y.-J.; Peng, C.-Y.; Sun, H.-C.; Liu, C.W.; Hsu, Y.-C.; Shih, C.-C.; Chen, J.-S.; CHEE-WEE LIU | ECS Transactions | | | |
2013 | Radiation impact of EUV on high-performance Ge MOSFETs | CHEE-WEE LIU ; Chen, Y.-T.; Chang, H.-C.; Wong, I.-H.; Sun, H.-C.; Ciou, H.-J.; Yeh, W.-T.; Luo, S.-J.; CHEE-WEE LIU | IEEE Electron Device Letters | | | |
2011 | Recovery of light induced degradation of micromorph solar cells by reverse bias | CHEE-WEE LIU ; Sun, H.-C.; Chen, W.-D.; Cheng, T.H.; Yang, Y.-J.; Liu, C.W.; Shih, H.-T.; CHEE-WEE LIU | ECS Transactions | | | |
2008 | Stress-induced hump effects of p-channel polycrystalline silicon thin-film transistors | CHEE-WEE LIU ; Huang, C.-F.; Peng, C.-Y.; Yang, Y.-J.; Sun, H.-C.; Chang, H.-C.; Kuo, P.-S.; Chang, H.-L.; Liu, C.-Z.; CHEE-WEE LIU | IEEE Electron Device Letters | | | |
2010 | Threshold voltage and mobility extraction of NBTI degradation of poly-Si thin-film transistors | CHEE-WEE LIU ; Sun, H.-C.; Huang, C.-F.; Chen, Y.-T.; Wu, T.-Y.; Liu, C.W.; Hsu, Y.-J.; Chen, J.-S.; CHEE-WEE LIU | IEEE Transactions on Electron Devices | | | |