1997 | A Hybrid Algorithm for Test Point Selection for Scan-Based BIST. | Tsai, Huan-Chih; Cheng, Kwang-Ting; Lin, Chih-Jen; Bhawmik, Sudipta; CHIH-JEN LIN | Proceedings of the 34st Conference on Design Automation, Anaheim, California, USA, Anaheim Convention Center, June 9-13, 1997. | 0 | 0 | |
2000 | Static property checking using ATPG vs. BDD techniques. | Huang, Chung-Yang; Yang, Bwolen; Tsai, Huan-Chih; Cheng, Kwang-Ting; CHUNG-YANG HUANG | Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000 | 0 | 0 | |