Results 1-4 of 4 (Search time: 0.006 seconds).

	Issue Date	Title	Author(s)	Source	scopus	WOS
1	2005	Column Parity and Row Select (CPRS): BIST Diagnosis for Errors in Multiple Scan Chains	H.M. Lin; J. C. M. Li; CHIEN-MO LI	International Test Conference	11	0
2	2008	IEEE 1500 Compatible Secure Test Wrapper For Embedded IP Cores	Geng-Ming Chiu; C.-Y. Chiu; R-Y. Wen; James Chien-Mo Li; CHIEN-MO LI	International Test Conference	4	0
3	2009	Power Scan: DFT for Power Switches in VLSI Designs	B. C. Bai; CHIEN-MO LI	International Test Conference
4	2011	Test-Clock Domain Optimization for Peak Power-Supply Noise Reduction During Scan	R.Y. Wen; Y.C. Huang; M.H. Tsai; K.Y. Liao; J. C.-M. Li; M.-T. Chang; M.-H. Tsai; C.-M. Tseng; H.-C. Li; CHIEN-MO LI	International Test Conference	2	0