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Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link | |
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1 | 2022 | Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer-Scale Growth and Beyond | Lee Y.-C; Chang S.-W; Chen S.-H; Chen S.-L; Chen H.-L.; HSUEN-LI CHEN | Advanced Science | 12 | 9 |