第 1 到 25 筆結果,共 25 筆。
公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 | |
---|---|---|---|---|---|---|---|
1 | 2015 | In-situ doped and tensily stained ge junctionless gate-all-around nFETs on SOI featuring I<inf>on</inf> = 828 μa/μm, I<inf>on</inf>/I<inf>off</inf> ? 1×10<sup>5</sup>, DIBL= 16-54 mV/V, and 1.4X external strain enhancement | Wong, I.-H.; Chen, Y.-T.; Huang, S.-H.; Tu, W.-H.; Chen, Y.-S.; Shieh, T.-C.; Lin, T.-Y.; Lan, H.-S.; Liu, C.W.; CHEE-WEE LIU | International Electron Devices Meeting, IEDM | 7 | 0 | |
2 | 2015 | Junctionless Gate-all-around pFETs on Si with In-situ doped Ge channel | Wong, I.-H.; Chen, Y.-T.; Huang, S.-H.; Tu, W.-H.; Huang, C.-H.; Chen, Y.-S.; Shieh, T.-C.; Liu, C.W.; CHEE-WEE LIU | International Symposium on VLSI Technology, Systems, and Applications | 0 | 0 | |
3 | 2015 | Junctionless Gate-All-Around pFETs Using In-situ Boron-Doped Ge Channel on Si | Wong, I.-H.; Chen, Y.-T.; Huang, S.-H.; Tu, W.-H.; Chen, Y.-S.; Liu, C.W.; CHEE-WEE LIU | IEEE Transactions on Nanotechnology | 25 | 25 | |
4 | 2014 | Gate-all-around Ge FETs | Liu, C.W.; Chen, Y.-T.; Hsu, S.-H.; CHEE-WEE LIU | ECS Transactions | 0 | 0 | |
5 | 2014 | Ge gate-all-around FETs on Si | Liu, C.W.; Wong, I.-H.; Chen, Y.-T.; Tu, W.-H.; Huang, S.-H.; Hsu, S.-H.; CHEE-WEE LIU | Proceedings - 2014 IEEE 12th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014 | 1 | 0 | |
6 | 2014 | Fabrication and low temperature characterization of Ge (110) and (100) p-MOSFETs | Wong, I.-H.; Chen, Y.-T.; Yan, J.-Y.; Ciou, H.-J.; Chen, Y.-S.; Liu, C.W.; CHEE-WEE LIU | IEEE Transactions on Electron Devices | 20 | 17 | |
7 | 2013 | Mobility strain response and low temperature characterization of Ge p-MOSFETs | Wong, I.-H.; Chen, Y.-T.; Ciou, H.-J.; Chen, Y.-S.; Yan, J.-Y.; Liu, C.W.; CHEE-WEE LIU | Device Research Conference, DRC | 0 | 0 | |
8 | 2013 | Radiation impact of EUV on high-performance Ge MOSFETs | Chen, Y.-T.; Chang, H.-C.; Wong, I.-H.; Sun, H.-C.; Ciou, H.-J.; Yeh, W.-T.; Luo, S.-J.; Liu, C.W.; CHEE-WEE LIU | IEEE Electron Device Letters | 2 | 2 | |
9 | 2013 | EUV degradation of high performance Ge MOSFETs | Chen, Y.-T.; CHEE-WEE LIU et al. | 2013 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2013 | 0 | 0 | |
10 | 2012 | Planar and 3D Ge FETs | Liu, C.W.; Chang, H.-C.; Lin, C.-M.; Chen, Y.-T.; CHEE-WEE LIU | ICSICT 2012 - 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology | 0 | 0 | |
11 | 2012 | Germanium gate-all-around pFETs on SOI | Chang, H.-C.; Hsu, S.-H.; Chu, C.-L.; Chen, Y.-T.; Tu, W.-H.; Sung, P.-J.; Luo, G.-Li.; Yin, Y.-C.; Liu, C.W.; CHEE-WEE LIU | ECS Transactions | 1 | 0 | |
12 | 2011 | Strain response of high mobility germanium n-channel metal-oxide- semiconductor field-effect transistors on (001) substrates | Chen, Y.-T.; Lan, H.-S.; Hsu, W.; Fu, Y.-C.; Lin, J.-Y.; Liu, C.W.; CHEE-WEE LIU | Applied Physics Letters | 10 | 9 | |
13 | 2011 | Voltage linearity improvement of HfO<inf>2</inf>-based metal-insulator- metal capacitors with H<inf>2</inf> O prepulse treatment | Lin, C.-M.; Chen, Y.-T.; Lee, C.-H.; Chang, H.-C.; Chang, W.-C.; Chang, H.-L.; Liu, C.W.; CHEE-WEE LIU | Journal of the Electrochemical Society | 4 | 3 | |
14 | 2011 | Electron scattering in Ge metal-oxide-semiconductor field-effect transistors | Lan, H.-S.; Chen, Y.-T.; Hsu, W.; Chang, H.-C.; Lin, J.-Y.; Chang, W.-C.; Liu, C.W.; CHEE-WEE LIU | Applied Physics Letters | 13 | 11 | |
15 | 2010 | Flexible single-crystalline Ge p-channel thin-film transistors with schottky-barrier source/drain on polyimide substrates | Hsu, W.; Peng, C.-Y.; Lin, C.-M.; Chen, Y.-Y.; Chen, Y.-T.; Ho, W.-S.; Liu, C.W.; CHEE-WEE LIU | IEEE Electron Device Letters | 4 | 3 | |
16 | 2010 | Capacitorless 1T memory cells using channel traps at grain boundaries | Chen, Y.-T.; Sun, H.-C.; Huang, C.-F.; Wu, T.-Y.; Liu, C.W.; Hsu, Y.-J.; Chen, J.-S.; CHEE-WEE LIU | IEEE Electron Device Letters | 8 | 8 | |
17 | 2010 | Enhanced voltage linearity of HfO<inf>2</inf> metal-insulator-metal capacitors by H<inf>2</inf>O prepulsing treatment on bottom electrode | Lin, C.-M.; Chen, Y.-T.; Lee, C.-H.; Chang, H.-C.; Chang, W.-C.; Liu, C.W.; CHEE-WEE LIU | ECS Transactions | 0 | 0 | |
18 | 2010 | Single-crystalline Ge p-channel thin-film transistors with Schottky-barrier source/drain on flexible polyimide substrates | Hsu, W.; Lin, C.-M.; Peng, C.-Y.; Chen, Y.-Y.; Chen, Y.-T.; Ho, W.-S.; Liu, C.W.; CHEE-WEE LIU | International Symposium on VLSI Technology, System and Application, VLSI-TSA 2010 | 0 | 0 | |
19 | 2010 | Threshold voltage and mobility extraction of NBTI degradation of poly-Si thin-film transistors | Sun, H.-C.; Huang, C.-F.; Chen, Y.-T.; Wu, T.-Y.; Liu, C.W.; Hsu, Y.-J.; Chen, J.-S.; CHEE-WEE LIU | IEEE Transactions on Electron Devices | 2 | 3 | |
20 | 2009 | Dynamic bias temperature instability of p-channel polycrystalline silicon thin-film transistors | Huang, C.-F.; Sun, H.-C.; Kuo, P.-S.; Chen, Y.-T.; Liu, C.W.; Hsu, Y.-J.; Chen, J.-S.; CHEE-WEE LIU | International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA | 5 | 0 | |
21 | 2009 | A design of 1T memory cells using channel traps for long data retention time | Chen, Y.-T.; Huang, C.-F.; Sun, H.-C.; Wu, T.-Y.; Ku, C.-Y.; Liu, C.W.; Hsu, Y.-C.; Chen, J.-S.; CHEE-WEE LIU | 2009 International Semiconductor Device Research Symposium | 0 | 0 | |
22 | 2009 | Dynamic bias instability of p-channel polycrystalline-silicon thin-film transistors induced by impact ionization | Huang, C.-F.; Sun, H.-C.; Yang, Y.-J.; Chen, Y.-T.; Ku, C.-Y.; Liu, C.W.; Hsu, Y.-J.; Shih, C.-C.; Chen, J.-S.; CHEE-WEE LIU | IEEE Electron Device Letters | 14 | 13 | |
23 | 2009 | Optimization of a saddle-like FinFET by device simulation for sub-50nm DRAM application | Chang, H.-C.; Kuo, P.-S.; Peng, C.-Y.; Chen, Y.-T.; Chen, W.-Y.; Liu, C.W.; CHEE-WEE LIU | 2009 International Semiconductor Device Research Symposium, ISDRS '09 | 2 | 0 | |
24 | 2008 | Comprehensive study of bias temperature instability on polycrystalline silicon thin-film transistors | Huang, C.-F.; Chen, Y.-T.; Sun, H.-C.; Liu, C.W.; Hsu, Y.-C.; Shih, C.-C.; Lin, K.-C.; Chen, J.-S.; CHEE-WEE LIU | International Conference on Solid-State and Integrated Circuits Technology, ICSICT | 3 | 0 | |
25 | 2008 | A new NBTI characterization method on polycrystalline silicon thin-film transistors | Sun, H.-C.; Huang, C.-F.; Chen, Y.-T.; Liu, C.W.; Hsu, Y.-C.; Shih, C.-C.; Chen, J.-S.; CHEE-WEE LIU | IDW '08 - 15th International Display Workshops |