第 1 到 3 筆結果,共 3 筆。
公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 | |
---|---|---|---|---|---|---|---|
1 | 2018 | Test pattern compression for probabilistic circuits | Chang, C.-M.; Yang, K.-J.; Li, J.C.-M.; CHIEN-MO LI | Proceedings of the Asian Test Symposium | 0 | 0 | |
2 | 2018 | Parallel order ATPG for test compaction | Chen, Y.-W.; Ho, Y.-H.; Chang, C.-M.; Yang, K.-C.; Li, M.-T.; Li, J.C.-M.; CHIEN-MO LI | 2018 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2018 | 5 | 0 | |
3 | 2017 | Robust test pattern generation for hold-time faults in nanometer technologies | Ho, Y.-H.; Chen, Y.-W.; Chang, C.-M.; Yang, K.-C.; Li, J.C.-M.; CHIEN-MO LI | 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017 | 1 | 0 |