第 1 到 4 筆結果,共 4 筆。
公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 | |
---|---|---|---|---|---|---|---|
1 | 2018 | Machine-learning-based dynamic IR drop prediction for ECO | Fang, Y.-C.; Lin, H.-Y.; Su, M.-Y.; Li, C.-M.; Fang, E.J.-W.; CHIEN-MO LI | IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD | 38 | 0 | |
2 | 2018 | IR drop prediction of ECO-revised circuits using machine learning | Lin, S.-Y.; Fang, Y.-C.; Li, Y.-C.; Liu, Y.-C.; Yang, T.-S.; Lin, S.-C.; Li, C.-M.; Fang, E.J.-W.; CHIEN-MO LI | Proceedings of the IEEE VLSI Test Symposium | 16 | 0 | |
3 | 2017 | Test Methodology for Dual-rail Asynchronous Circuits | Huang, K.-Y.; Shen, T.-Y.; Li, C.-M.; CHIEN-MO LI | Proceedings - Design Automation Conference | 3 | 0 | |
4 | 2009 | Power scan: OFT for power switches in VLSI designs | Bai, B.-C.; Li, C.-M.; Kifli, A.; Tsai, E.; CHIEN-MO LI | Proceedings - International Test Conference | 0 | 0 |