DC 欄位 | 值 | 語言 |
dc.contributor | Dept. of Electr. Eng., National Taiwan Univ. | en |
dc.contributor.author | Yu, C.-Y. | en |
dc.contributor.author | Chen, T.C. | en |
dc.contributor.author | Lee, M.H. | en |
dc.contributor.author | Huang, S.-H. | en |
dc.contributor.author | Lee, L.S. | en |
dc.contributor.author | Liu, C.W. | en |
dc.creator | Yu, C.-Y.; Chen, T.C.; Lee, M.H.; Huang, S.-H.; Lee, L.S.; Liu, C.W. | en |
dc.date | 2004-07 | en |
dc.date.accessioned | 2007-04-19T04:19:25Z | - |
dc.date.accessioned | 2018-07-06T13:43:34Z | - |
dc.date.available | 2007-04-19T04:19:25Z | - |
dc.date.available | 2018-07-06T13:43:34Z | - |
dc.date.issued | 2004-07 | - |
dc.identifier | N/A | en |
dc.identifier.issn | N/A | en |
dc.identifier.uri | http://ntur.lib.ntu.edu.tw//handle/246246/2007041910042837 | - |
dc.format | application/pdf | en |
dc.format.extent | 224698 bytes | - |
dc.format.mimetype | application/pdf | - |
dc.language | en-US | en |
dc.language.iso | en_US | - |
dc.relation | Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the | en |
dc.relation.ispartof | Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the | - |
dc.title | Electrical and optical reliability improvement of HfO2 gate dielectric by deuterium and hydrogen incorporation | en |
dc.type | journal article | en |
dc.relation.pages | - | - |
dc.identifier.uri.fulltext | http://ntur.lib.ntu.edu.tw/bitstream/246246/2007041910042837/1/01345578.pdf | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.openairetype | journal article | - |
item.languageiso639-1 | en_US | - |
item.grantfulltext | open | - |
item.cerifentitytype | Publications | - |
item.fulltext | with fulltext | - |
顯示於: | 電機工程學系
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