https://scholars.lib.ntu.edu.tw/handle/123456789/155898
Title: | Oxide roughness effect on tunneling current of MOS diodes | Authors: | Hsu, B.-C. Chen, K.-F. Lai, C.-C. Lee, S.W. Liu, C.W. |
Issue Date: | 2002 | Journal Volume: | 49 | Journal Issue: | 12 | Start page/Pages: | - | Source: | IEEE Transactions on Electron Devices | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/148180 |
Appears in Collections: | 電機工程學系 |
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