https://scholars.lib.ntu.edu.tw/handle/123456789/173644
標題: | 製程偏移對可測試性設計技術效能影響的評估 A FABRICATION PROCESS VARIATION BASED APPROACH TO EVALUATE DESIGN-FOR-TEST TECHNIQUES |
作者: | 陳逸任 黃俊郎 Chen, Yi-Ren Huang, Jiun-Lang |
關鍵字: | 可測試性設計;混合信號電路測試;類比/數位 轉換器;積分非線性錯誤;微分非線性錯誤;design-for-test;mixed-signal testing;analogto- digital converter;INL;DNL | 公開日期: | 二月-2005 | 出版社: | 臺北市:國立臺灣大學工學院 | 期: | No. 93 | 起(迄)頁: | - | 來源出版物: | Bulletin of the College of Engineering | 摘要: | 類比/混合信號系統的可測試性設計技術由於缺乏 有效的評估方法,接受度一直不高。在這篇論文中,我們 提出一個評估可測試性設計效能的技術。該方法考慮無可 避免的製程偏移對待測電路與可測試性電路性能的影 響,因此比過去的方法更為實際,也更能反映出實際生產 線上的製程缺陷。我們以一個內含Ramp Generator 可測試 性設計的Flash ADC 為例,分析的結果發現原來的可測試 性設計並不能偵測到動態缺陷, 必須重新設計Ramp Generator。 One of the hurdles that prevent the wide acceptance of analog/mixed-signal design-for-test techniques is lack of a realistic and practical evaluation methodology. In this paper, a method to assess the quality of a design-for-test design (together with the associated test set) is proposed. Based on fabrication process variation information, our design-for-test evaluation criterion considers the inevitable adverse effects of fabrication process imperfection on both the functional and design-for-test circuits, and therefore will correlate better with the manufacturing test quality than past proposals. To validate our method, a flash ADC with a built-in ramp generator is used as an ex-ample. The proposed approach shows that the original designfor- test design fails capturing dynamic defects, and a redesign of the ramp generator or the test set is necessary to enhance the manufacturing test quality. |
URI: | http://ntur.lib.ntu.edu.tw//handle/246246/2006092712273575777 | 其他識別: | 2006092712273575777 |
顯示於: | 電子工程學研究所 |
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