https://scholars.lib.ntu.edu.tw/handle/123456789/288950| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | JENN-GWO HWU | en |
| dc.creator | Hwu, Jenn-Gwo and Ho, I-Hsiu | - |
| dc.date.accessioned | 2018-09-10T03:26:48Z | - |
| dc.date.available | 2018-09-10T03:26:48Z | - |
| dc.date.issued | 1990 | - |
| dc.identifier.uri | http://www.scopus.com/inward/record.url?eid=2-s2.0-0025454106&partnerID=MN8TOARS | - |
| dc.identifier.uri | http://scholars.lib.ntu.edu.tw/handle/123456789/288950 | - |
| dc.language | en | en |
| dc.relation.ispartof | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | - |
| dc.source | AH | - |
| dc.title | Oxide resistance characterization in MOS structures by the voltage decay method | - |
| dc.type | journal article | en |
| dc.identifier.doi | 10.1143/JJAP.29.1243 | - |
| dc.relation.pages | 1243-1247 | - |
| dc.relation.journalvolume | 29 | - |
| dc.relation.journalissue | 7 | - |
| item.cerifentitytype | Publications | - |
| item.openairetype | journal article | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
| item.fulltext | no fulltext | - |
| item.grantfulltext | none | - |
| crisitem.author.dept | Electrical Engineering | - |
| crisitem.author.dept | Electronics Engineering | - |
| crisitem.author.orcid | 0000-0001-9688-0812 | - |
| crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
| crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
| Appears in Collections: | 電機工程學系 | |
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