https://scholars.lib.ntu.edu.tw/handle/123456789/292422| Title: | Effect of oxide resistance on the characterization of interface trap density in MOS structures | Authors: | Lin, J.-J. Hwu, J.-G. JENN-GWO HWU |
Issue Date: | 1991 | Journal Volume: | 34 | Journal Issue: | 12 | Start page/Pages: | 1449-1454 | Source: | Solid State Electronics | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0026375594&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/292422 |
DOI: | 10.1016/0038-1101(91)90043-X |
| Appears in Collections: | 電機工程學系 |
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