https://scholars.lib.ntu.edu.tw/handle/123456789/297650
標題: | Magnetic domain imaging of exchange bias system NiO/Cu/NiFe by Kerr microscopy | 作者: | Chang, Y. M. MINN-TSONG LIN Pan, W. Ho, C. H. Yao, Y. D. de Haas, O. Schafer, R. Schneider, F. C. M. |
關鍵字: | Exchange bias; Kerr microscopy; Magnetic domain | 公開日期: | 2002 | 卷: | 239 | 期: | 44929 | 起(迄)頁: | 375-377 | 來源出版物: | Journal of Magnetism and Magnetic Materials | 摘要: | A discussion on magnetic domain imaging of exchange bias system NiO/Cu/NiFe was presented by Kerr microscopy. Two types of magnetic domain structures with different Cu thickness were observed by Kerr microscopy for the NiO/Cu/NiFe system. The results showed a frozen-in magnetic structure coinciding with domain wall at room temperature at Cu = 8 Å. The domain images expanded with frustrated domain wall instead at Cu = 2 Å. |
URI: | http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000175187300115&KeyUID=WOS:000175187300115 http://scholars.lib.ntu.edu.tw/handle/123456789/297650 https://www.scopus.com/inward/record.uri?eid=2-s2.0-0036465345&doi=10.1016%2fS0304-8853%2801%2900670-9&partnerID=40&md5=47b4dd950a0e94309b7577eabc51dbd8 |
ISSN: | 03048853 | DOI: | 10.1016/s0304-8853(01)00670-9 | SDG/關鍵字: | Antiferromagnetic materials; Ferromagnetic materials; Imaging techniques; Magnetic anisotropy; Magnetron sputtering; Microscopic examination; Nickel compounds; Nucleation; Optical Kerr effect; Kerr microscopy; Magnetic domains |
顯示於: | 物理學系 |
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