https://scholars.lib.ntu.edu.tw/handle/123456789/303337
Title: | An analysis of small-signal gate-drain resistance effect on RF power MOSFETs | Authors: | SHEY-SHI LU | Issue Date: | 2003 | Journal Volume: | 50 | Journal Issue: | 2 | Start page/Pages: | 525-528 | Source: | IEEE Transactions on Electron Devices | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0038394648&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/303337 |
DOI: | 10.1109/TED.2002.808516 |
Appears in Collections: | 電機工程學系 |
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