https://scholars.lib.ntu.edu.tw/handle/123456789/303337| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | SHEY-SHI LU | en |
| dc.creator | Lin, Y.-S. and Lu, S.-S. | - |
| dc.date.accessioned | 2018-09-10T04:33:09Z | - |
| dc.date.available | 2018-09-10T04:33:09Z | - |
| dc.date.issued | 2003 | - |
| dc.identifier.uri | http://www.scopus.com/inward/record.url?eid=2-s2.0-0038394648&partnerID=MN8TOARS | - |
| dc.identifier.uri | http://scholars.lib.ntu.edu.tw/handle/123456789/303337 | - |
| dc.language | en | en |
| dc.relation.ispartof | IEEE Transactions on Electron Devices | - |
| dc.source | AH-Scopus to ORCID | - |
| dc.title | An analysis of small-signal gate-drain resistance effect on RF power MOSFETs | - |
| dc.type | journal article | en |
| dc.identifier.doi | 10.1109/TED.2002.808516 | - |
| dc.relation.pages | 525-528 | - |
| dc.relation.journalvolume | 50 | - |
| dc.relation.journalissue | 2 | - |
| item.fulltext | no fulltext | - |
| item.cerifentitytype | Publications | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
| item.grantfulltext | none | - |
| item.openairetype | journal article | - |
| crisitem.author.dept | MediaTek-NTU Research Center | - |
| crisitem.author.orcid | 0000-0003-3106-3154 | - |
| crisitem.author.parentorg | Others: University-Level Research Centers | - |
| Appears in Collections: | 電機工程學系 | |
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