https://scholars.lib.ntu.edu.tw/handle/123456789/309330
Title: | An analysis of the bias dependence of scattering parameters S11 and S22 of SiGe heterojunction bipolar transistors (HBTs) | Authors: | SHEY-SHI LU | Issue Date: | 2004 | Start page/Pages: | 611-614 | Source: | IEEE Radio Frequency Integrated Circuits Symposium, RFIC, Digest of Technical Papers | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-4444264550&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/309330 |
Appears in Collections: | 電機工程學系 |
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