https://scholars.lib.ntu.edu.tw/handle/123456789/315732
Title: | Depth-profile study of the electronic structures at Ga 2 O 3 (Gd 2 O 3) and Gd 2 O 3-GaN interfaces by X-ray photoelectron spectroscopy | Authors: | Lay, TS Liao, YY Hung, Wei-Hsiu Hong, M Kwo, J Mannaerts, JP MINGHWEI HONG |
Issue Date: | 2005 | Journal Volume: | 278 | Journal Issue: | 1 | Start page/Pages: | 624-628 | Source: | Journal of Crystal Growth | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/315732 |
Appears in Collections: | 應用物理研究所 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.