Erratum: Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si<inf>1-x-y</inf>Ge<inf>x</inf>C<inf>y</inf> alloy layers on Si (100)" (Appl. Phys. Lett. (1995) 67 (3915))

Please use this identifier to cite or link to this item: https://scholars.lib.ntu.edu.tw/handle/123456789/316584

Title:	Erratum: Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si<inf>1-x-y</inf>Ge<inf>x</inf>C<inf>y</inf> alloy layers on Si (100)" (Appl. Phys. Lett. (1995) 67 (3915))
Authors:	Amour, A.St. Liu, C.W. Sturm, J.C. Lacroix, Y. Thewalt, M.L.W. CHEE-WEE LIU
Issue Date:	1995
Source:	Applied Physics Letters
URI:	http://www.scopus.com/inward/record.url?eid=2-s2.0-51149205708&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/316584
Appears in Collections:	電機工程學系

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