https://scholars.lib.ntu.edu.tw/handle/123456789/318036
Title: | Column Parity and Row Select (CPRS): BIST Diagnosis for Errors in Multiple Scan Chains | Authors: | H.M. Lin J. C. M. Li CHIEN-MO LI |
Issue Date: | Oct-2005 | Source: | International Test Conference | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/318036 | DOI: | 10.1109/TEST.2005.1584078 |
Appears in Collections: | 電子工程學研究所 |
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01584078.pdf | 199.12 kB | Adobe PDF | View/Open |
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