https://scholars.lib.ntu.edu.tw/handle/123456789/321619
Title: | Applications of damage models to reliability investigations for input/output electronic connectors | Authors: | KUO-CHI LIAO | Issue Date: | 2006 | Source: | American Society of Mechanical Engineers, Safety Engineering and Risk Analysis Division, SERA | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-84920632493&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/321619 |
Appears in Collections: | 生物機電工程學系 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.